Wafer scratch detection demo

Improve semiconductor manufacturing efficiency with this interactive Spotfire demo designed to help you quickly identify wafer scratches. The demo leverages cutting-edge analytics techniques to detect scratches across multiple wafer lots, providing you with actionable insights to optimize production yield. Whether you’re managing a small batch or analyzing large-scale manufacturing, jump straight into this demo and make use of the tools to highlight defects, streamline troubleshooting, and enhance overall production performance.