Wafer Test Measurement Correlation Analysis demo

Jump straight into this Spotfire demo and measure the correlation between streamed wafer test measurements and a selected target variable. Pinpoint the sensors and parameters most associated with test failures. Streamline wafer testing processes and enhance operational efficiency by monitoring real-time data to provide continuous visibility. Empower quick, data-driven decision-making to reduce test failures and optimize performance in this high-tech manufacturing Spotfire demo environment.